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iruh33pa13b20k eldrs test report february 2006 revision a international rectifier currently does not have a dscc approved radiation hardness assurance program for mil-prf-38534.
eldrs test report iruh33pa13b20k february 2006, rev a 205 crawford st, leominster, ma 01453 tel: 976-534-5776 www.irf.com 2 table of contents introduction .??????????????????. 3 summary of results ??????????????... 3 test method .?????????????????? 3 test plan .???????????????????. 3 test facility ??????????????????. 4 test results ...?????????????????. 5 conclusion .??????????????????...9 appendix a ? electrical data appendix b ? radiation test specification
eldrs test report iruh33pa13b20k february 2006, rev a 205 crawford st, leominster, ma 01453 tel: 976-534-5776 www.irf.com 3 introduction this test report covers the total ionizi ng dose tests performed on the iruh33pa13b20k adjustable low dropout linear r egulator in a hermetic package. the eldrs test was performed on ten samples of the device from producti on lot h903185, which had completed mil-prf- 38534 ?h? level assembly and screening. on january 19, 2006 international rectifier tested this device for eldrs hardness at the university of massachusetts, nuclear research facility using their co 60 source. summary of results all of the test samples passed the post radiation test requirements for total ionizing dose levels up to 44.6k rad(si). the results show more degradation on the off-bias devices for all tests parameters as a function of radi ation. the ?on? biased samples passed the post radiation test requirements for all of the required dose levels. test method the test method used as a guide in the dev elopment of the test plan was mil-std-883, method 1019 ionizing radiation, c ondition c. this method establ ishes the basic requirements for the performance and exec ution of the tests. test plan the samples were exposed to co 60 irradiation in both an ?on? and ?off? biased state per the requirements of the test plan and the radiation test specification. post radiation testing of the devices occurred at the umass facility after each dose step was complete. the devices were tested starting on january 20, 2006 fo r post radiation effects for dose levels up to 100k rad(si) at a dose rate of 0.065 rad(si)/sec. on biased serial number s: 111, 114, 89, 67, 96 off biased serial num bers: 94, 93, 85, 117, 76 control samples: 71 and 107. the radiation test specificati on is included in appendix b. the testing occurred in the following manner: 1.0 purpose the purpose of this test is to characterize and qualif y the eldrs effects for inter national rectifier?s hybrid low dropout regulator devices. the data resulting from the tests may be incorporated in the ir data sheet for the product. 2.0 test responsibility international rectifier shall be responsible for condu cting the tests, which shall be performed at the university of massachusetts research reactor facility . international rectifier shall be responsible for the final test report. 3.0 test facility 3.1 nuclear reactor the university of massachusetts research reacto r shall be used to provide the source for gamma radiation. umrr will also provide information on dose rate, total dose, irradiation test times and dosimetry for this evaluation.
eldrs test report iruh33pa13b20k february 2006, rev a 205 crawford st, leominster, ma 01453 tel: 976-534-5776 www.irf.com 4 3.2 test equipment the necessary test equipment including interface b oard, cables, power supplie s, measurement system, etc. shall be provided by international rectifier. 3.3 sample size sample size shall be determined based on device type, characterization parameters. as a minimum, the sample size shall meet the requirements of mil- prf- 38534. sample size for this tid evaluation equals 12 devices. five of the samples shall be biased with the wo rst-case input voltage of 6.8 volts and five samples shall be biased ?in-circuit? with the power supply turned off. two samples shall be maintained as controls of which one shall be tested at each dose step. 4.0 test devices 4.1 the following device is planned for total ionizing dose characterization: a. iruh33pa13b20k 4.2 all devices shall be subjected to a minimum of 160h rs of burn-in and electrical ly tested over the entire operating range prior to radiation exposure. 4.3 all devices shall be tested afte r each radiation exposure per t090104g within 1 hour and placed back on to radiation exposure within 2 hours. 5.0 test method mil-std-883, method 1019 condition c shall be used to establish the procedure for all testing described herein. 6.0 record keeping the reactor facility shall prov ide dosimetry data for the co 60 source. each exposure run shall be cataloged with the appropriate number in order to maintain correlation to the appropriate data set. ir will be responsible for collecting and compiling the test data. 7.0 test report the test report shall include the following information: a. device type(s), serial numbers, wafer lot identification (per active component) b. test dates c. facility, source type d. bias conditions e. comments and observations f. pre and post electrical data g. summary descriptive incl uding graphs (if applicable) test facility the university of massachusetts, lowell, nuclear research reactor is a 1 mega-watt, uranium 235 enhanced core reactor. the umass lowell r adiation laboratory pr ovides controlled radiation environments and analytic al measurement services to government organizations and to industry. the laboratory provides facilities for proton, neutron, and ga mma environments. the gamma cave is an irradiation room inside this facility having an equi-dimensional volume of 512 cubic feet. a wide range of dose rates, 1gray (100 rad) per hour to 10,000 gray (1 mrad) per hour, is available. several small ports penetra te one shielding wall to provide access for instrumentation cables.
eldrs test report iruh33pa13b20k february 2006, rev a 205 crawford st, leominster, ma 01453 tel: 976-534-5776 www.irf.com 5 test results the key pre and post radiation test results are show n in tables 1 thru 10. in figures 1-6, the parametric shifts are shown grap hically for all exposed devices. the raw test data for all the parameters tested is shown in ap pendix a. as outlined in the test plan, five of the devices exposed to total ionizing dose irradiation were biased ?on? with the maximum input voltage and five samples were placed in the bias circui t with the power supply off or biased ?off?. all samples passed the post radiati on test requirements up to 44. 6k rad(si). the parameters affected the most by the ioni zing radiation were output voltage, ripple rejection, and shutdown threshold voltage with the wors t-case condition being the ?off? bias. the output voltage shift over radi ation exposure with a 1.5a l oad current was +6.2% for the ?off? biased samples and + 3.7% for the ?on? biased samples after exposure 100k rad(si). the shift at 44.6k rad(si) exposure was +4.7 % for the ?off? biased samples and + 3.2% for the ?on? biased samples. table 1 ?on? biased samples, vout, vin=3.3v @1.5a t#1 vout krad level limits serial # 0 6 22 45 100 min max u/m 71 2.510 2.510 2.505 2.508 2.509 2.375 2.625 v 107 2.494 2.495 2.495 2.493 2.492 2.375 2.625 v 111 2.497 2.510 2.545 2.572 2.587 2.375 2.625 v 114 2.509 2.520 2.550 2.579 2.595 2.375 2.625 v 89 2.506 2.520 2.554 2.588 2.601 2.375 2.625 v 67 2.503 2.515 2.549 2.580 2.597 2.375 2.625 v 96 2.506 2.524 2.566 2.588 2.602 2.375 2.625 v min 2.497 2.510 2.545 2.572 2.587 2.375 2.625 v avg 2.504 2.518 2.553 2.581 2.596 2.375 2.625 v max 2.509 2.524 2.566 2.588 2.602 2.375 2.625 v table 2 ?off? biased samples, vout, vin=3.3v @1.5a t#1 vout krad level limits serial # 0 6 22 45 100 min max u/m 71 2.510 2.510 2.505 2.508 2.509 2.375 2.625 v 107 2.494 2.495 2.495 2.493 2.492 2.375 2.625 v 94 2.505 2.516 2.569 2.608 2.665 2.375 2.625 v 93 2.499 2.517 2.563 2.610 2.655 2.375 2.625 v 85 2.500 2.514 2.561 2.604 2.651 2.375 2.625 v 117 2.510 2.529 2.570 2.612 2.661 2.375 2.625 v 76 2.499 2.515 2.556 2.600 2.651 2.375 2.625 v min 2.499 2.514 2.556 2.600 2.651 2.375 2.625 v avg 2.503 2.518 2.564 2.607 2.657 2.375 2.625 v max 2.510 2.529 2.570 2.612 2.665 2.375 2.625 v
eldrs test report iruh33pa13b20k february 2006, rev a 205 crawford st, leominster, ma 01453 tel: 976-534-5776 www.irf.com 6 table 3 ?on? biased samples, vdrop, iout=3a t#8 vdrop krad level limits serial # 0 6 22 45 100 min max u/m 71 0.20 0.20 0.19 0.19 0.20 0 0.4 v 107 0.19 0.19 0.19 0.19 0.19 0 0.4 v 111 0.20 0.21 0.22 0.23 0.24 0 0.4 v 114 0.20 0.21 0.22 0.23 0.24 0 0.4 v 89 0.19 0.20 0.22 0.23 0.24 0 0.4 v 67 0.19 0.21 0.22 0.23 0.25 0 0.4 v 96 0.20 0.20 0.22 0.23 0.25 0 0.4 v min 0.192 0.197 0.215 0.227 0.239 0 0.4 v avg 0.195 0.206 0.217 0.231 0.244 0 0.4 v max 0.199 0.212 0.219 0.234 0.250 0 0.4 v table 4 ?off? biased samples, vdrop, iout=3a t#8 vdrop krad level limits serial # 0 6 22 45 100 min max u/m 71 0.20 0.20 0.19 0.19 0.20 0 0.4 v 107 0.19 0.19 0.19 0.19 0.19 0 0.4 v 94 0.20 0.20 0.22 0.22 0.25 0 0.4 v 93 0.19 0.20 0.22 0.23 0.25 0 0.4 v 85 0.21 0.22 0.23 0.25 0.23 0 0.4 v 117 0.20 0.22 0.22 0.24 0.27 0 0.4 v 76 0.20 0.21 0.22 0.24 0.25 0 0.4 v min 0.192 0.204 0.215 0.223 0.232 0 0.4 v avg 0.199 0.212 0.222 0.237 0.252 0 0.4 v max 0.210 0.223 0.230 0.249 0.265 0 0.4 v table 5 ?on? biased samples, current limit, vin=3.3 t#9 current limit krad level limits serial # 0 6 22 45 100 min max u/m 71 9.2 9.2 9.2 9.1 8.9 3 10 a 107 8.9 9.2 9.3 9.1 9.1 3 10 a 111 8.8 9.1 9.3 9.1 8.8 3 10 a 114 8.8 9.1 9.3 8.9 8.9 3 10 a 89 8.8 9.1 9.3 9.1 8.9 3 10 a 67 9.1 9.0 8.9 8.9 8.5 3 10 a 96 8.9 8.8 9.1 9.1 8.8 3 10 a min 8.795 8.845 8.935 8.868 8.511 3 10 a avg 8.890 9.026 9.161 8.986 8.783 3 10 a max 9.112 9.117 9.252 9.095 8.874 3 10 a
eldrs test report iruh33pa13b20k february 2006, rev a 205 crawford st, leominster, ma 01453 tel: 976-534-5776 www.irf.com 7 table 6 ?off? biased samples, current limit, vin=3.3 t#9 current limit krad level limits serial # 0 6 22 45 100 min max u/m 71 9.2 9.2 9.2 9.1 8.9 3 10 a 107 8.9 9.2 9.3 9.1 9.1 3 10 a 94 8.7 8.8 8.8 9.1 9.1 3 10 a 93 8.7 8.8 9.1 9.5 8.8 3 10 a 85 8.5 8.5 8.8 8.5 8.5 3 10 a 117 8.9 9.1 9.1 9.1 8.9 3 10 a 76 8.5 9.1 9.1 9.1 8.9 3 10 a min 8.477 8.481 8.798 8.505 8.511 3 10 a avg 8.649 8.861 8.980 9.040 8.838 3 10 a max 8.885 9.117 9.116 9.459 9.101 3 10 a table 7 ?on? biased samples, ripple rejection = 120hz. t#10 ripple rejection krad level limits serial # 0 6 22 45 100 min max u/m 71 97.2 97.2 99.2 99.2 98.2 40 200 db 107 98.2 98.1 98.2 99.2 99.8 40 200 db 111 98.6 100.4 98.6 89.5 61.9 40 200 db 114 97.6 99.2 100.4 91.8 61.9 40 200 db 89 99.8 100.5 98.7 89.5 60.7 40 200 db 67 100.4 101.2 99.2 89.6 60.8 40 200 db 96 97.6 99.8 101.1 89.5 61.9 40 200 db min 97.600 99.230 98.630 89.450 60.740 40 200 db avg 98.810 100.224 99.590 89.970 61.460 40 200 db max 100.400 101.200 101.100 91.820 61.940 40 200 db table 8 ?off? biased samples, ripple rejection = 120hz t#10 ripple rejection krad level limits serial # 0 6 22 45 100 min max u/m 71 97.2 97.2 99.2 99.2 98.2 40 200 db 107 98.2 98.1 98.2 99.2 99.8 40 200 db 94 98.1 99.8 95.1 63.3 58.0 40 200 db 93 99.2 99.2 96.3 64.9 59.7 40 200 db 85 98.1 100.5 95.9 61.9 59.7 40 200 db 117 98.1 99.2 95.5 64.8 59.7 40 200 db 76 99.7 98.6 95.9 64.9 59.7 40 200 db min 98.060 98.630 95.110 61.900 58.020 40 200 db avg 98.622 99.468 95.744 63.946 59.370 40 200 db max 99.740 100.500 96.310 64.860 59.720 40 200 db
eldrs test report iruh33pa13b20k february 2006, rev a 205 crawford st, leominster, ma 01453 tel: 976-534-5776 www.irf.com 8 table 9 ?on? biased samples, voltage shutdown t#11 vshdn krad level limits serial # 0 6 22 45 100 min max u/m 71 1.38 1.38 1.37 1.35 1.36 1 1.7 v 107 1.32 1.34 1.31 1.35 1.36 1 1.7 v 111 1.34 1.36 1.45 1.51 1.53 1 1.7 v 114 1.36 1.38 1.45 1.47 1.53 1 1.7 v 89 1.36 1.38 1.45 1.51 1.53 1 1.7 v 67 1.32 1.34 1.43 1.45 1.51 1 1.7 v 96 1.34 1.38 1.51 1.53 1.55 1 1.7 v min 1.319 1.338 1.432 1.447 1.507 1 1.7 v avg 1.344 1.367 1.459 1.493 1.527 1 1.7 v max 1.360 1.380 1.505 1.530 1.548 1 1.7 v table 10 ?off? biased samp les, voltage shutdown t#11 vshdn krad level limits serial # 0 6 22 45 100 min max u/m 71 1.38 1.38 1.37 1.35 1.36 1 1.7 v 107 1.32 1.34 1.31 1.35 1.36 1 1.7 v 94 1.32 1.38 1.47 1.50 1.47 1 1.7 v 93 1.34 1.34 1.45 1.49 1.47 1 1.7 v 85 1.32 1.36 1.43 1.47 1.44 1 1.7 v 117 1.34 1.40 1.47 1.49 1.47 1 1.7 v 76 1.32 1.36 1.41 1.45 1.44 1 1.7 v min 1.319 1.338 1.411 1.447 1.444 1 1.7 v avg 1.327 1.367 1.449 1.478 1.457 1 1.7 v max 1.339 1.401 1.474 1.499 1.465 1 1.7 v
eldrs test report iruh33pa13b20k february 2006, rev a 205 crawford st, leominster, ma 01453 tel: 976-534-5776 www.irf.com 9 parametric shifts as a fun ction of eldrs radiation figure 1 vout (vin 3.3v @1.5a) 2.480 2.500 2.520 2.540 2.560 2.580 2.600 2.620 2.640 2.660 2.680 110100 krad vout 71_cntrl 107_cntrl 94 93 85 117 76 111 114 89 67 96 figure 2 vout (vin 3.3v @50ma) 2.480 2.500 2.520 2.540 2.560 2.580 2.600 2.620 2.640 2.660 2.680 1 10 100 krad vout 71_cntrl 107_cntrl 94 93 85 117 76 111 114 89 67 96
eldrs test report iruh33pa13b20k february 2006, rev a 205 crawford st, leominster, ma 01453 tel: 976-534-5776 www.irf.com 10 figure 3 vout (vin 3.8v @3a) 2.480 2.500 2.520 2.540 2.560 2.580 2.600 2.620 2.640 2.660 2.680 110100 krad vout 71_cntrl 107_cntrl 94 93 85 117 76 111 114 89 67 96 figure 4 vout (vin 2.8v @50ma) 2.450 2.500 2.550 2.600 2.650 2.700 1 10 100 krad vout 71_cntrl 107_cntrl 94 93 85 117 76 111 114 89 67 96
eldrs test report iruh33pa13b20k february 2006, rev a 205 crawford st, leominster, ma 01453 tel: 976-534-5776 www.irf.com 11 figure 5 vref (3.3v @25ma) 1.250 1.270 1.290 1.310 1.330 1.350 1 10 100 krad vref 71_cntrl 107_cntrl 94 93 85 117 76 111 114 89 67 96 figure 6 ripple rej ratio (f=120hz) 50.0 60.0 70.0 80.0 90.0 100.0 1 10 100 krad ripple rej (db) 71_cntrl 107_cntrl 94 93 85 117 76 111 114 89 67 96
eldrs test report iruh33pa13b20k february 2006, rev a 205 crawford st, leominster, ma 01453 tel: 976-534-5776 www.irf.com 12 conclusion the iruh33pa13b20k has demonstrated hardness to eldrs radiation exposure up to 44.6 krad(si) at dose rate of 0.065 rad (si)/sec wit h no parametric failures when device is in the ?on? or ?off? bias condition and the results show it to m eet all the post radiation test requirements. there are parametric shifts for output voltage, dr opout voltage, ripple rejection, and shutdown threshold voltage, wh ich need to be considered in designs where tight tolerances over the life of the product need to be maintained.
eldrs test report iruh33pa13b20k february 2006, rev a 205 crawford st, leominster, ma 01453 tel: 976-534-5776 www.irf.com 13 appendix a electrical data
eldrs test report iruh33pa13b20k february 2006, rev a 205 crawford st, leominster, ma 01453 tel: 976-534-5776 www.irf.com 14 electrical test data (pre-radiation) test vout1 vout2 v out3 vout4 vout5 line reg load reg vdrop current limit ripple rej. vshdn vout @shdn ishdn* max limit 2.525 2.625 2.625 2.625 2.625 6.25 73.8 0.4 10 200 1.6 100 ---- min limit 2.475 2.375 2.375 2.375 2.375 -6.25 -73.8 0 3 65 1.0 -100 ---- serial # (v) (v) (v) (v) (v) (mv) (mv) (v) (a) (db) (v) (mv) (ua) 71 2.510 2.505 2.507 2.504 1.268 -0.678 4. 370 0.201 9.152 97.18 1.378 -1.967 0.151 107 2.494 2.492 2.493 2.492 1.258 0.181 4. 541 0.193 8.907 98.18 1.319 -1.059 0.147 94 2.505 2.501 2.503 2.502 1.271 -1.718 3. 237 0.195 8.658 98.06 1.319 -1.033 0.145 93 2.499 2.497 2.500 2.497 1.267 -0.407 2. 402 0.192 8.749 99.15 1.339 -1.133 0.145 85 2.500 2.497 2.501 2.498 1.267 -0.407 4. 260 0.210 8.477 98.06 1.319 -1.119 0.144 117 2.510 2.506 2.509 2.505 1.273 0.090 2. 834 0.203 8.885 98.10 1.339 -0.975 0.151 76 2.499 2.497 2.501 2.497 1.267 -0.904 4. 157 0.195 8.477 99.74 1.319 -1.018 0.149 111 2.497 2.495 2.497 2.494 1.266 0.045 3. 010 0.195 8.840 98.58 1.339 -1.248 0.146 114 2.509 2.505 2.510 2.505 1.272 -0.542 4. 206 0.199 8.840 97.60 1.360 -1.578 0.150 89 2.506 2.504 2.507 2.505 1.272 0.090 3. 547 0.192 8.795 99.83 1.360 -1.535 0.145 67 2.503 2.501 2.501 2.501 1.269 -0.136 2. 428 0.192 9.112 100.40 1.319 -2.338 0.151 96 2.506 2.503 2.505 2.503 1.265 -0.949 3. 199 0.197 8.862 97.64 1.340 -1.332 0.146 * data collected for information purposes only parameter not specified for post radiation. electrical test data (post radiation ? 6k rad(si)) test vout1 vout2 v out3 vout4 vout5 line reg load reg vdrop current limit ripple rej. vshdn vout @shdn ishdn* max limit 2.625 2.625 2.625 2.625 2.625 12.5 147.6 0.4 10 200 1.7 100 ---- min limit 2.375 2.375 2.375 2.375 2.375 -12.5 -147.6 0 3 65 1.0 -100 ---- serial # (v) (v) (v) (v) (v) (mv) (mv) (v) (a) (db) (v) (mv) (ua) 71 2.510 2.505 2.507 2.504 1.268 -0.677 4. 37 0.201 9.152 97.18 1.378 -1.967 0.1514 107 2.495 2.493 2.496 2.494 1.263 -0.225 4. 297 0.189 9.198 98.14 1.336 -1.034 0.146 94 2.516 2.513 2.516 2.514 1.274 -1.31 4. 468 0.204 8.790 99.79 1.378 -1.034 0.1427 93 2.517 2.514 2.516 2.514 1.277 -0.993 4. 023 0.204 8.845 99.23 1.338 -1.277 0.1474 85 2.514 2.512 2.515 2.513 1.276 -0.722 2. 932 0.223 8.481 100.50 1.359 -1.233 0.1413 117 2.529 2.523 2.526 2.524 1.281 -0.406 3. 008 0.219 9.072 99.19 1.401 -0.557 0.1464 76 2.515 2.512 2.517 2.513 1.276 0.1355 4. 805 0.208 9.117 98.63 1.359 -2.111 0.1435 111 2.510 2.505 2.510 2.506 1.273 -0.180 3. 21 0.212 9.072 100.40 1.359 -2.212 0.1444 114 2.520 2.517 2.520 2.519 1.278 0.6777 5. 719 0.212 9.072 99.23 1.380 -2.457 0.1462 89 2.520 2.516 2.520 2.517 1.277 -0.180 3. 026 0.197 9.117 100.50 1.380 -0.859 0.1445 67 2.515 2.512 2.514 2.512 1.275 0.3614 3. 396 0.208 9.026 101.20 1.338 -2.338 0.1512 96 2.524 2.522 2.524 2.522 1.279 0.4969 2. 368 0.204 8.845 99.79 1.380 -1.332 0.1461 * data collected for information purposes only parameter not specified for post radiation.
eldrs test report iruh33pa13b20k february 2006, rev a 205 crawford st, leominster, ma 01453 tel: 976-534-5776 www.irf.com 15 electrical test data (post radiation ? 22k rad(si)) test vout1 vout2 v out3 vout4 vout5 line reg load reg vdrop current limit ripple rej. vshdn vout @shdn ishdn* max limit 2.625 2.625 2.625 2.625 2.625 12.5 147.6 0.4 10 200 1.7 100 ---- min limit 2.375 2.375 2.375 2.375 2.375 -12.5 -147.6 0 3 40 1.0 -100 ---- serial # (v) (v) (v) (v) (v) (mv) (mv) (v) (a) (db) (v) (mv) (ua) 71 2.505 2.503 2.507 2.504 1.268 0.4516 4. 534 0.189 9.207 99.150 1.369 -1.565 0.149 107 2.495 2.492 2.495 2.491 1.262 -0.541 3. 915 0.189 9.252 98.150 1.306 -1.738 0.1488 94 2.569 2.566 2.569 2.565 1.300 -0.541 4. 025 0.223 8.844 95.110 1.474 -2.227 0.1388 93 2.563 2.560 2.563 2.558 1.296 -0.271 3. 761 0.219 9.071 96.310 1.453 -3.149 0.1399 85 2.561 2.557 2.559 2.557 1.295 0 3.208 0.230 8.798 95.870 1.432 -3.351 0.1387 117 2.570 2.567 2.569 2.566 1.300 0.7226 3. 438 0.223 9.116 95.520 1.474 -3.235 0.1433 76 2.556 2.552 2.556 2.551 1.291 -0.180 4. 166 0.215 9.071 95.910 1.411 -3.423 0.1417 111 2.545 2.541 2.547 2.540 1.289 0 5.714 0.215 9.252 98.630 1.453 -0.686 0.1367 114 2.550 2.548 2.551 2.547 1.291 0.6774 2.704 0.219 9.252 100.400 1.453 -1.162 0.1419 89 2.554 2.551 2.556 2.552 1.294 0.271 4. 518 0.215 9.252 98.670 1.453 -1.867 0.1386 67 2.549 2.544 2.549 2.545 1.289 0.4968 2. 37 0.219 8.935 99.150 1.432 -1.507 0.1393 96 2.566 2.562 2.566 2.562 1.301 0.6774 4.78 0.215 9.113 101.100 1.505 -2.602 0.1421 * data collected for information purposes only parameter not specified for post radiation. electrical test data (post radiation ? 44k rad(si)) test vout1 vout2 v out3 vout4 vout5 line reg load reg vdrop current limit ripple rej. vshdn vout @shdn ishdn* max limit 2.625 2.625 2.625 2.625 2.625 12.5 147.6 0.4 10 200 1.7 100 ---- min limit 2.375 2.375 2.375 2.375 2.375 -12.5 -147.6 0 3 40 1.0 -100 ---- serial # (v) (v) (v) (v) (v) (mv) (mv) (v) (a) (db) (v) (mv) (ua) 71 2.508 2.503 2.510 2.503 1.267 -0.0903 7.459 0.189 9.134 99.240 1.352 -0.982 0.1478 107 2.493 2.491 2.494 2.491 1.260 -0.0903 3.813 0.186 9.089 99.240 1.352 -1.73 0.1458 94 2.608 2.606 2.608 2.606 1.317 1.265 2. 861 0.223 9.089 63.290 1.499 -1.241 0.1384 93 2.610 2.608 2.609 2.606 1.323 -0.0452 2.134 0.234 9.459 64.860 1.488 -1.942 0.1406 85 2.604 2.601 2.605 2.601 1.319 2.169 3. 323 0.249 8.505 61.900 1.468 -2.072 0.1381 117 2.612 2.609 2.611 2.609 1.323 0 1.983 0.238 9.050 64.820 1.488 -3.31 0.1411 76 2.600 2.597 2.600 2.597 1.317 0.6327 3. 439 0.238 9.095 64.860 1.447 -2.417 0.1409 111 2.572 2.571 2.573 2.571 1.305 0.4972 1. 604 0.234 9.050 89.450 1.509 -2.417 0.1376 114 2.579 2.578 2.579 2.577 1.307 1.085 1. 54 0.227 8.868 91.820 1.468 -3.152 0.1395 89 2.588 2.585 2.588 2.584 1.311 -0.2712 2.311 0.227 9.050 89.450 1.509 -3.282 0.1361 67 2.580 2.578 2.580 2.578 1.307 0.0452 1. 783 0.234 8.868 89.640 1.447 -3.742 0.1356 96 2.588 2.586 2.589 2.587 1.311 0.4972 2. 485 0.231 9.095 89.490 1.530 -4.074 0.1369 * data collected for information purposes only parameter not specified for post radiation.
eldrs test report iruh33pa13b20k february 2006, rev a 205 crawford st, leominster, ma 01453 tel: 976-534-5776 www.irf.com 16 electrical test data (post radiation ? 100k rad(si)) test vout1 vout2 v out3 vout4 vout5 line reg load reg vdrop current limit ripple rej. vshdn vout @shdn ishdn* max limit 2.625 2.625 2.625 2.625 2.625 12.5 147.6 0.4 10 200 1.7 100 ---- min limit 2.375 2.375 2.375 2.375 2.375 -12.5 -147.6 0 3 40 1.0 -100 ---- serial # (v) (v) (v) (v) (v) (mv) (mv) (v) (a) (db) (v) (mv) (ua) 71 2.509 2.503 2.508 2.503 1.269 0 5.659 0.197 8.855 98.150 1.357 -2.027 0.1499 107 2.492 2.491 2.493 2.491 1.260 0 4.497 0.189 9.127 99.830 1.357 -0.719 0.1475 94 2.665 2.661 2.664 2.660 1.349 -0.677 0. 7832 0.254 9.101 58.020 1.465 -2.405 0.1455 93 2.655 2.655 2.654 2.653 1.346 1.401 0. 467 0.254 8.829 59.670 1.465 -0.836 0.1408 85 2.651 2.650 2.650 2.649 1.343 0.4518 0. 7231 0.232 8.511 59.720 1.444 -1.225 0.1418 117 2.661 2.659 2.660 2.658 1.348 -0.858 2. 436 0.265 8.874 59.720 1.465 -2.045 0.145 76 2.651 2.648 2.651 2.647 1.343 1.446 1. 91 0.254 8.874 59.720 1.444 -2.75 0.1435 111 2.587 2.584 2.585 2.584 1.310 1.129 2. 896 0.243 8.829 61.940 1.527 -1.542 0.1346 114 2.595 2.591 2.594 2.592 1.315 0.2259 3. 316 0.243 8.874 61.900 1.527 -2.16 0.1359 89 2.601 2.598 2.601 2.598 1.318 -0.677 3. 027 0.239 8.874 60.740 1.527 -2.074 0.1332 67 2.597 2.593 2.597 2.594 1.316 -0.632 3. 856 0.250 8.511 60.780 1.507 -4.059 0.1339 96 2.602 2.599 2.603 2.599 1.318 0.5421 4. 724 0.247 8.829 61.94 1.548 -2.376 0.1338 * data collected for information purposes only parameter not specified for pre-radiation.
eldrs test report iruh33pa13b20k february 2006, rev a 205 crawford st, leominster, ma 01453 tel: 976-534-5776 www.irf.com 17 appendix b radiation test specification
eldrs test report iruh33pa13b20k february 2006, rev a 205 crawford st, leominster, ma 01453 tel: 976-534-5776 www.irf.com 18 specification # t090104g revision: a ecn # date: ir base part no . irruh33pa13b20k product discription: adjustable low dropout voltage regulato r automatic test tester: pxi test console 04-134-tc prog. ref. test symbol test conditions rad level: min max units a output voltage v out vin = 3.30 vdc pre rad 2.475 2.525 vdc iout = 1.5 a a output voltage v out vin = 3.3 vdc pre rad 2.375 2.625 vdc iout = 50 ma a output voltage v out vin = 3.8 vdc pre rad 2.375 2.625 vdc iout = 3.0 a a output voltage v out vin = 2.8 vdc pre rad 2.375 2.625 vdc iout = 50 ma a output voltage v ref vin = 3.3 vdc pre rad 1.225 1.305 vdc iout = 25ma a line regulation vrline 2.9v < vi n < 3.8v pre rad -6.25 6.25 mvdc iout = 50 ma a load regulation vrload vin = 3.3v pre rad -73.8 73.8 mvdc 50ma < io < 3.0a a dropout voltage vdrop iout = 3a pre rad 0 0.40 vdc a current limit i limit vin = 3.3 vdc pre rad 3.0 10.0 a a ripple rejection rrej f= 120 hz pre rad 65 200 db iout = 50 ma a shutdown vshutdown pre rad 1.0 1.6 v threshold a output voltage vout shdn vin = 3.3 vdc pre rad -0.1 +0.1 v at shutdown iout = 50 ma vshdn = +5 vdc a shutdown ishutdown vin = 3.3 vdc pre rad --- --- ua pin current iout = 50 ma vshdn = +5 vdc notes: 2. these tests are performed for information purposes only. this is proprietary information of international rectifier hi-rel products and it is understood that this will not be divulged to a third party or used in any way prejudicial to the interest of international rectifier hi-rel products. 1. regulator shall be biased at a nominal vout of 2.5v with radjust set at 976 ohms and tested to the limits specified on the data sheet. 2 notes table 1: pre radiation tests, 25c tests only 1 vin = 5.0 vdc, vshutdown ramp from 0.8v to 4.8v, output monitored for 100mv dro p below
eldrs test report iruh33pa13b20k february 2006, rev a 205 crawford st, leominster, ma 01453 tel: 976-534-5776 www.irf.com 19 automatic test tester: pxi test console 04-134-tc prog. ref. test symbol test conditions rad level: min max units b output voltage v out vin = 3.30 vdc post rad 2.375 2.625 vdc iout = 1.5 a b output voltage v out vin = 3.3 vdc post rad 2.375 2.625 vdc iout = 50 ma b output voltage v out vin = 3.8 vdc post rad 2.375 2.625 vdc iout = 3.0 a b output voltage v out vin = 2.8 vdc post rad 2.375 2.625 vdc iout = 50 ma b output voltage v ref vin = 3.3 vdc post rad 1.202 1.328 vdc iout = 25ma b line regulation vrline 2.9v < vin < 3.8v post rad -12.5 12.5 mvdc iout = 50 ma b load regulation vrload vin = 3.3v post rad -147.6 147.6 mvdc 50ma < io < 3.0a b dropout voltage vdrop iout = 3a post rad 0 0.40 vdc b current limit i limit vin = 3.3 vdc post rad 3.0 10.0 a b ripple rejection rrej f= 120 hz post rad 40 200 db iout = 50 ma b shutdown vshutdown post rad 1.0 1.7 v threshold b output voltage vout shdn vin = 3.3 vdc post rad -0.1 +0.1 v at shutdown iout = 50 ma vshdn = +5 vdc b shutdown ishutdown vin = 3.3 vdc post rad --- --- ua pin current iout = 50 ma vshdn = +5 vdc notes: 2. these tests are performed for information purposes only. this is proprietary information of international rectifier hi-rel products and it is understood that this will not be divulged to a third party or used in any way prejudicial to the interest of international rectifier hi-rel products. 2 notes table 2: post radiation tests, 25c tests only 1 vin = 5.0 vdc, vshutdown ramp from 0.8v to 4.8v, output 1. regulator shall be biased at a nominal vout of 2.5v with radjust set at 976 ohms and tested to the limits specified on the data sheet.
eldrs test report iruh33pa13b20k february 2006, rev a 205 crawford st, leominster, ma 01453 tel: 976-534-5776 www.irf.com 20 radiation circuit 05-043-ta 30k, 20k, 50k, 50k, 50k gamma cave unbiased, in circuit with power supply off 0.01 to 0.10 rad(si)/sec tf-02-008 05-043-ta unbiased, in circuit with power supply off 30k, 20k, 50k, 50k, 50k 50 to 300 rad(si)/sec tf-02-011 bias conditions dose step profile program card number dose rate range board number dose step profile test temperature board number low dose rate 3 dose rate range 0.01 to 0.10 rad(si)/sec 25c +/-5c table 3: total dose radiation requirements high dose rate 3 vin = 6.8v, vout = 2.5v, io=10ma bias conditions chamber 30k, 20k, 50k, 50k, 50k 50 to 300 rad(si)/sec tf-02-011 05-043-ta gamma cave 25c +/-5c 3. performed at during initial qualification of the device and retested only when specified by quality assurance due to a chang e per mil-prf-38534. 25c +/-5c 25c +/-5c test temperature tf-02-008 05-043-ta program card number chamber hot cell hot cell 30k, 20k, 50k, 50k, 50k vin = 6.8v, vout = 2.5v, io=10ma vin 976 ohm 1% 1uf 50v 1uf 50v 250 ohm 5% 1 2 3 4 5

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